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Semiconductor Manufacturing

Deep Trench Capcitors as land-side decoupling capacitors and IPD technology from TSMC used for Apple’s A10 application processor - System Plus Consulting

TSMC Deep Trench Capacitor

Product code
EUR 3 490
Mobile & Consumer
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Due to TSMC, Integrated Passive Devices (IPD) are back in the mobile industry. Information about the Apple A10 application processor (AP) integrated into the firm’s latest flagship, the iPhone 7, mentions the use of the first PoP Wafer Level Packaging for consumer devices developed by TSMC, called integrated Fan-Out – Package-on-Package (inFO-PoP). To enable this, TSMC has also integrated a brand new technology that has never been proposed before for high volume products. It is using high-density Deep Trench Capacitors (DTCs) on silicon substrates as land-side decoupling capacitors.

Located under the inFO-PoP, the Land-Side Capacitor (LSC) is in flip-chip configuration and supported by an extra layer on the printed circuit (PCB). The LSC has been developed by TSMC using trench capacitors to increase the capacitive area without changing the footprint of the component. This can compete with multilayer ceramic capacitor (MLCC) technology.

In this report, we show the differences from ceramic technology and the innovations of this capacitor, including the trench silicon, oxide deposition and electrical performances. The process is compared to IPDiA technology. Detailed comparison with the LSC in the Exynos 8 and the Snapdragon 820 APs will explain the pros and cons of TSMC’s LSC technology.

This DTC process enables TSMC to offer a very thin capacitor, with high density and the same footprint as a MLCC 0204 component. The result is very cost-effective, as  comparisons with ceramic capacitors in this report will show.

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Company Profile and Supply Chain

Physical Analysis

  • Physical Analysis Methodology
  • iPhone 7 Plus Disassembly
    • A10 and LSC die removal
  • LSC Packaging Analysis
    • Die view and dimensions
    • Die marking
    • Die overview and delayering
    • Die cross-section
    • Die process
  • Land-Side Decoupling Capacitor Comparison
    • Packaged LSC comparison
    • Deep Trench Capacitor Comparison

Electrical Performance

  • Frequency Characteristics

Manufacturing Process Flow

  • Chip Fabrication Unit
  • DTC Process Flow

Cost Analysis

  • Supply Chain Description
  • Yield Hypotheses
  • Die Cost Analysis
    • Wafer cost
    • Die cost
  • Final Test Cost
  • Component Cost

Estimated Price Analysis

Cost and performance comparison

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